Continuous Particulate Monitor with X-ray Fluorescence PX-375

Overview

There has been growing concern regarding particulate matter (PM) pollution and its affects on health. For effective preventative measures, source appointment of PM is extremely important. Therefore, indication of PM elemental concentration is also necessary in addition to PM mass concentration. PX-375 enables automatic sampling, continuous online PM quantitative and qualitative analysis and rapid air pollution source appointment.

Features

Continuous analysis of PM mass and the elemental concentration by a single unit directly in the field.
Adoption of world proven technologies: X-ray fluorescence & Beta-ray attenuation.
HORIBA’s filter tape provides excellent sensitivity and precise performance
Installed CMOS camera enables observation of collected particulate sample on the filter.
User friendly display and operations

Specifications

Product name	Continuous Particulate Monitor with X-ray Fluorescence
Model	PX-375
Measured object	Particulate matter (PM₁₀, PM_2.5, TSP)
Measurement content	Particulate mass concentration and element concentration

Common

Flow rate	16.7L/min
Sampling pump	Linear drive system, externally installed
Filter tape	None-woven PTFE fabric filter
Spot tape interval	20/25/50/100mm selectable
Filter tape replacement interval	Approx. 1 month (In case of 100mm spot interval)
Ambient operation temperature	10˚C~30˚C
Relative humidity	0~80% RH noncondensing
Altitude	1000m or less
Power supply	AC100V~240V ±10%, 50/60Hz±1%
Power consumption	Approx. 400VA
External dimension	430mm(W)×550mm(D)×285mm(H) (without sampling pipe and measurement head)
Weight	Approx. 40kg (Without sampling pipe and measurement head)
Data output	CSV file (Average PM mass and elemental concentration)
External connection	Ethernet^TM, USB, RS-232C* (option)

*Please consult about communication and instrument composition separately.

Mass analyzer unit

Measurement method	Beta-ray attenuation
PM₁₀	US EPA Louvered PM₁₀ Inlet
PM_2.5	BGI VSCC^TM Cyclone
TSP	TSP Inlet
Measurement range	0~200/500/1000μg/m³
Repeatability	±2% (against reference foil value)
Span drift	±3% (24hours)
Lowest detection limit (2σ)	±2μg/m³ (24hours)
Sampling and measurement cycle	0.5/1/2/3/4/6/8/12/24 hours

Element analyzer unit

Measurement method	Energy dispersive X-ray spectroscopy
Detectable elements	See Table 2 “Detectable Elements”. Standard parameter is S, Ti, Cr, Mn, Ni, Cu, Zn, Pb, Al, Si, K, Ca, V, Fe, As.
Primary X-ray filter	Automatic switching for light metals/heavy metals
Tube voltage	Automatic switching for 15kV/50kV
Detector	SDD (Silicon Drift Detector)
Sample image	CMOS camera
Lowest detection limit (2σ)	Recommended EPA Method IO 3.3 See Table 1 “Lowest Detection Limit (Example)”
Measurement range	Up to measurement time
Analysis time	1000s (16.6 min) as standard 100 / 200 / 500 / 1000 / 2000 / 5000 / 10000s selectable
Calibration material for X-ray intensity for standard parameter	NIST SRM 2783, other materials (option)
Safety functions for X-ray	Internal lock system Key switch X-ray indication light